Electrochemical Nano-Materials and System Lab.

02. Professor

 
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Professor

 
 
À¯ºÀ¿µ(Bongyoung Yoo)
byyoo@hanyang.ac.kr
38-308
+82-31-400-5229
+82-31-417-3701
 

¤ý2018-Present : Professor, Hanyang University
¤ý2013-2018 : Associate Professor, Hanyang University
¤ý2008-2013 : Assistant professor, Hanyang University
¤ý2004-2008 : Post Doc. Lecturer and Laboratory manager, UC Riverside
¤ý2003-2004 : Research Staff, UCLA
¤ý2000-2003 : Graduate Research Assistant, UCLA
¤ý1994-1999 : Process Engineer, SAMSUNG Electronics

University of California at Los Angeles, Materials Science and Engineering
Oct. 1999 Sep. 2003
Ph.D. from Materials Science and Engineering
Thesis : Electrodeposition of Iron Group – Vanadium Magnetic Thin Films

Yonsei University, Graduate school, Seoul, Korea
Mar. 1990 - Feb. 1992
Master of Science from Metallurgical Engineering
Thesis : CO2 Laser Beam Absorptance Measurement on Steel Surface by Two
Dimensional F.D.M.

Yonsei University,  Seoul, Korea
Mar. 1986 - Feb. 1990
Bachelor of Science from Metallurgical Engineering

Samsung Technology Award (1999) – title: Development of Cu Interconnection Process
Electrochemical Society Student Grant (2003)

¡ß Division of Materials and Chemical Engineering, Hanyang University

Mar. 2008 – present
Professor

  • Electrochemical Nanostructure Engineering and Materials Processing
  • ¡ß Department of Environmental and Chemical Engineering, UC Riverside

    Sep. 2004 – Jan. 2008
    Post Doctoral Researcher, Lecturer, and Laboratory manager of Dr. Myung Lab.                                                                               
    - Development of nanoengineered materials with electrochemistry

  • Metal-CNT nanocomposite films
  • Nanoparticles-CNT hybrid nanostructures
  • Segmented nanowires (i.e. magnetic/conducting polymer/magnetic, magnetic/semiconductor/magnetic)
  • Semiconducting nanowires (e.g. CdTe)
  • Thermoelectric nanowires (e.g. BiTe, BiSbTe)
  • Zero-valent iron (ZVI) nanoparticles
  • - Development of nanosensor array

  • Pd and FePd nanowire based H2 sensor
  • Conducting polymer coated SWNTs based CO2 and NH3 sensor
  • Single conducting polymer nanowire based bio/chemical sensor
  • - Development of alumina nanotemplate

  • Three-dimensional alumina nanotemplate
  • - Magneto-transport studies of 1-D nanosturcture

  • Magnetic assembling of nanostructures
  • Fabrication of SWNT based spintronics devices
  • Domain wall movement within ferromagnetic nanowire with artificial defects
  • Magnetoresistance of ferromagnetic nanowire
  • FePd shape memory nanowires
  • Development of thermoelectric power generator and cooler

  • Electrodeposition of BiTe and BiSbTe thin films, nanowires, and superlattice structures
  • Electrodeposition of PbTe thin films and nanowires
  • Electrodeposition of single crystalline PbTe nanocrystals
  • Development of Zero-Valence-Iron nanoparticles for heavy metal remediation

  • Cr(VI), As(V) remediation using ZVI nanoparticles
  • Supervising the graduate students and under-graduate students for research

    ¡ß Department of Chemical Engineering, UCLA
    Sep. 2003 – Aug. 2004
    Research Staff
    - Shock-resistive MEMS Magnetometer Project – DARPA Program
    - XYZ Frequency Selective Surface on Chip Project – NSF Program
    - Development of Hard Magnetic Iron group-Rare earth Thin Films with Electrodeposition
    - Development of Conducting Nanowire with Electrochemical Method

    ¡ß Department of Chemical Engineering, UCLA
    Aug. 2000 – Sep. 2003
    Graduate Research Assistant
    -MEMS Magnetometer Project – DARPA Program
    -XYZ Frequency Selective Surface on Chip Project – NSF Program
    -Development of low stress CoNi magnetic thin film
    -Electrodeposited Co/Cu thin film multilayer for GMR
    -Development high saturation magnetization CoFeV electrodeposited thin film

    ¡ß SAMSUNG Electronics Co., Ltd.,                                            
    Jan. 1994 - Aug. 1999    
    Process engineer, Process Development Team 3, Semiconductor R&D Center         

    Cu Interconnection Process Development for LOGIC Device:
    Cu Task Force Member    Apr. 1998 – Aug. 1999  
    - Module process integration for ECD Cu interconnection 
    - IMP Ta/TaN barrier process for Cu metallization
    - IMP Cu process for the seed layer of electroplating Cu
    - MOCVD Cu process for VIA fill and seed process

    Advanced Interconnection Process Development for DRAM   Jan. 1996 – Apr. 1998     
    - Process development of metal bit-line at COB structure for 256M, 1G, 4G DRAM and MDL(merged DRAM in Logic )
    -Technology development of barrier metal with Ionized Metal Plasma (IMP) PVD for deep sub-micron contacts (Joint Evaluation with Applied Materials Inc., USA)
    - RTP technology development for BEOL process
    - Study of physical and electrical phenomena at Si/metal-silicide interface for low contact resistance 

    SiH2Cl2 (DCS)-Tungsten Silicide Process & Hardware Development.  1995 – Jan. 1996    
    - Joint Development Project with Genus Inc.(USA) for DCS- based WSi2 process and development of LPCVD System
    - Process development for the dit dine of 4 M Fast SRAM process development for the gate and bit lines of 16 and 64 M DRAM

    TiSix/Poly-Si (Ti-polycide) Gate Line Process Development    Jan. 1994  - Feb. 1995
    - Process development of Ti-silicide gate structure for advanced DRAM
    - Evaluation of gate oxide reliability
    - Thermal stability of Ti-silicide gate line

  • Syed Mubeen, Ting Zhang, Bongyoung Yoo, Marc A. Deshusses, and Nosang V. Myung (2007)
    ¡¡ ¡°Palladium Nanoparticles Decorated Single-Walled Carbon Nanotube Hydrogen Sensor¡± Journal of physical chemistry C, 111, 6321-6327
  • Bongyoung Yoo, Feng Xiao, Krassimir N. Bozhilov, Jennifer Herman, Margaret A. Ryan, and Nosang V. Myung (2007) ¡°Electrodeposition of Thermoelectric Superlattice Nanowires¡± Advanced Materials, 19, 29
  • Yi-Chia Chou, Wen-Wei Wu, Shao-Liang Cheng, Bong-Young Yoo, Nosang Myung, Lih J. Chen, and K. N. Tu (2008) ¡°In-situ TEM Observation of Repeating Events of Nucleation in Epitaxial Growth of Nano CoSi2 in Nanowires of Si¡° Nano Letters 8 (8), 2194-2199